Computational Intelligence for Software Engineering Lab
MSc Recruiting Autumn 2022: We are looking for new members!
Our research focuses on the exciting intersection between software engineering and machine intelligence.
Recent Updates
Our new paper "FDG: A Precise Measurement of Fault Diagnosability Gain of Test Cases" is accepted at ISSTA 2022
A COINSE paper about fault diagnosability gain has been accepted at ISSTA 2022. [more...]Congratulations, Dr. Seongmin Lee!
Seongmin Lee successfully defended his PhD thesis, the second from from COINSE group. [more...]A new paper about automatically augmenting equivalent mutant dataset has been accepted at MUTATION 2022
We present an automated technique to augment equivalent mutant dataset. [more...]Our new paper "Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA" is accepted to ICSE-SEIP 2022
We present a technique for identifying shared root causes of test breakages by combining multiple information sources associated with the failing tests. [more...]Our paper "Predictive Mutation Analysis via Natural Language Channel in Source Code" is accepted to TOSEM
This paper aims to predict a full kill matrix resulted from mutation analysis by leveraging Natural Language channel in source and test code. [more...]A new paper about GUI smoke test repairing technique has been accepted at ICST 2022 Industry Track
We present a new repair technique for View Identification Failures (VIF) in GUI tests from a collaboration work between COINSE and Samsung Research. [more...]Latest Publications
- Kim, J., Feldt, R. and Yoo, S., Evaluating Surprise Adequacy for Deep Learning System Testing. ACM Transactions on Software Engineering and Methodology. to appear, (2022).
[pdf]
[bibtex]
@article{Kim2022ap, author = {Kim, Jinhan and Feldt, Robert and Yoo, Shin}, title = {Evaluating Surprise Adequacy for Deep Learning System Testing}, year = {2022}, month = jun, publisher = {Association for Computing Machinery}, address = {New York, NY, USA}, journal = {{ACM} Transactions on Software Engineering and Methodology}, volume = {to appear}, series = {TOSEM} }
- An, G. and Yoo, S., FDG: A Precise Measurement of Fault Diagnosability Gain of Test Cases. Proceedings of the 31st ACM SIGSOFT International Symposium on Software Testing and Analysis, to appear.
[pdf]
[bibtex]
@inproceedings{An2022pb, author = {An, Gabin and Yoo, Shin}, booktitle = {Proceedings of the 31st ACM SIGSOFT International Symposium on Software Testing and Analysis, to appear}, date-added = {2022-05-30 16:14:30 +0900}, date-modified = {2022-05-30 16:14:41 +0900}, series = {ISSTA 2022}, title = {{FDG}: A Precise Measurement of Fault Diagnosability Gain of Test Cases}, year = {2022} }
- Kang, S. and Yoo, S., Language Models Can Prioritize Patches for Practical Program Patching. Proceedings of the 3rd International Workshop on Automated Program Repair (to appear).
[pdf]
[bibtex]
@inproceedings{Kang2022kl, author = {Kang, Sungmin and Yoo, Shin}, booktitle = {Proceedings of the 3rd International Workshop on Automated Program Repair \emph{(to appear)}}, date-added = {2022-03-31 14:54:57 +0900}, date-modified = {2022-03-31 14:54:57 +0900}, title = {Language Models Can Prioritize Patches for Practical Program Patching}, year = {2022} }
- Chung, S. and Yoo, S., Augmenting Equivalent Mutant Dataset Using Symbolic Execution. Proceedings of the 17th International Workshop on Mutation Analysis.
[pdf]
[bibtex]
@inproceedings{Chung2022ae, author = {Chung, Seungjoon and Yoo, Shin}, booktitle = {Proceedings of the 17th International Workshop on Mutation Analysis}, series = {Mutation 2022}, title = {Augmenting Equivalent Mutant Dataset Using Symbolic Execution}, year = {2022} }
- An, G., Yoon, J., Sohn, J., Hong, J., Hwang, D. and Yoo, S., Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA. Proceedings of the 44th IEEE/ACM International Conference on Software Engineering - Software Engineering In Practice Track, to appear.
[pdf]
[bibtex]
@inproceedings{An2022qe, author = {An, Gabin and Yoon, Juyeon and Sohn, Jeongju and Hong, Jingun and Hwang, Dongwon and Yoo, Shin}, booktitle = {Proceedings of the 44th IEEE/ACM International Conference on Software Engineering - Software Engineering In Practice Track, to appear}, date-added = {2022-01-14 11:06:21 +0900}, date-modified = {2022-05-30 16:15:33 +0900}, series = {ICSE SEIP 2022}, title = {Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA}, year = {2022} }
- Kim, J., Jeon, J., Hong, S. and Yoo, S., Predictive Mutation Analysis via Natural Language Channel in Source Code. ACM Transactions on Software Engineering and Methodology. to appear, (2022).
[pdf]
[bibtex]
@article{Kim2022xy, author = {Kim, Jinhan and Jeon, Juyoung and Hong, Shin and Yoo, Shin}, date-added = {2022-01-14 11:03:15 +0900}, date-modified = {2022-01-14 11:03:15 +0900}, journal = {{ACM} Transactions on Software Engineering and Methodology}, title = {Predictive Mutation Analysis via Natural Language Channel in Source Code}, volume = {to appear}, year = {2022} }
- Yoon, J., Chung, S., Shin, K., Kim, J., Hong, S. and Yoo, S., Repairing Fragile GUI Test Cases Using Word and Layout Embedding. Proceedings of the 15th IEEE International Conference on Software Testing, Verification and Validation, Industry Track.
[pdf]
[bibtex]
@inproceedings{Yoon2022fs, author = {Yoon, Juyeon and Chung, Seungjoon and Shin, Kihyuck and Kim, Jinhan and Hong, Shin and Yoo, Shin}, booktitle = {Proceedings of the 15th IEEE International Conference on Software Testing, Verification and Validation, Industry Track}, date-added = {2022-01-14 11:02:40 +0900}, date-modified = {2022-01-14 11:02:40 +0900}, series = {ICST 2022}, title = {Repairing Fragile GUI Test Cases Using Word and Layout Embedding}, year = {2022} }