Computational Intelligence for Software Engineering Lab

Latest Publications

1. Kim, S. and Yoo, S., Multimodal Surprise Adequacy Analysis of Inputs for Natural Language Processing DNN Models. Proceedings of the 2nd ACM/IEEE International Conference on Automated Software Testing . [pdf] [bibtex]

     @inproceedings{Kim2021ct,
     author = {Kim, Seah and Yoo, Shin},
     booktitle = {Proceedings of the 2nd ACM/IEEE International Conference on Automated Software Testing },
     date-added = {2021-04-08 12:06:13 +0900},
     date-modified = {2021-04-08 12:08:02 +0900},
     series = {AST 2021},
     title = {Multimodal Surprise Adequacy Analysis of Inputs for Natural Language Processing DNN Models},
     year = {2021}
   }
   
   

2. Sohn, J., An, G., Hong, J., Hwang, D. and Yoo, S., Assisting Bug Report Assignment Using Automated Fault Localisation: An Industrial Case Study. Proceedings of the 14th IEEE International Conference on Software Testing, Verification and Validation. [bibtex]

     @inproceedings{Sohn2021ea,
     author = {Sohn, Jeongju and An, Gabin and Hong, Jingun and Hwang, Dongwon and Yoo, Shin},
     booktitle = {Proceedings of the 14th IEEE International Conference on Software Testing, Verification and Validation},
     date-added = {2021-02-01 14:00:57 +0900},
     date-modified = {2021-02-01 14:02:46 +0900},
     title = {Assisting Bug Report Assignment Using Automated Fault Localisation: An Industrial Case Study},
     year = {2021}
   }
   
   

3. Sohn, J., Kamei, Y., McIntosh, S. and Yoo, S., Leveraging Fault Localisation to Enhance Defect Prediction. Proceedings of the 28th IEEE International Conference on Software Analysis, Evolution and Reengineering. [bibtex]

     @inproceedings{Sohn2021eb,
     author = {Sohn, Jeongju and Kamei, Yasutaka and McIntosh, Shane and Yoo, Shin},
     booktitle = {Proceedings of the 28th IEEE International Conference on Software Analysis, Evolution and Reengineering},
     date-added = {2021-02-01 13:57:09 +0900},
     date-modified = {2021-02-01 13:57:09 +0900},
     series = {SANER 2021},
     title = {Leveraging Fault Localisation to Enhance Defect Prediction},
     year = {2021}
   }
   
   

4. Liu, K., Kim, D., Bissyande, T.F., Yoo, S. and Traon, Y.L., Mining Fix Patterns for FindBugs Violations. IEEE Transactions on Software Engineering. 47, 1, 165–188. [bibtex]

     @article{Liu2018aa,
     author = {Liu, K. and Kim, D. and Bissyande, T. F. and Yoo, S. and Traon, Y. Le},
     date-modified = {2021-02-12 14:42:32 +0900},
     issn = {0098-5589},
     journal = {IEEE Transactions on Software Engineering},
     number = {1},
     pages = {165--188},
     title = {Mining Fix Patterns for {F}ind{B}ugs Violations},
     volume = {47},
     year = {2021}
   }
   
   

5. Kim, J., Ju, J., Feldt, R. and Yoo, S., Reducing DNN Labelling Cost using Surprise Adequacy: An Industrial Case Study for Autonomous Driving. Proceedings of ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE Industry Track). [bibtex]

     @inproceedings{Kim2020zg,
     author = {Kim, Jinhan and Ju, Jeongil and Feldt, Robert and Yoo, Shin},
     booktitle = {Proceedings of ACM Joint European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE Industry Track)},
     date-added = {2020-11-03 18:37:54 +0900},
     date-modified = {2020-11-03 18:37:54 +0900},
     series = {ESEC/FSE 2020},
     title = {Reducing DNN Labelling Cost using Surprise Adequacy: An Industrial Case Study for Autonomous Driving},
     year = {2020},
     bdsk-file-1 = {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}
   }
   
   

6. Ralph, P. et al., Pandemic programming. Empirical Software Engineering. 25, 6, 4927–4961. [bibtex]

     @article{Ralph2020pd,
     author = {Ralph, Paul and Baltes, Sebastian and Adisaputri, Gianisa and Torkar, Richard and Kovalenko, Vladimir and Kalinowski, Marcos and Novielli, Nicole and Yoo, Shin and Devroey, Xavier and Tan, Xin and Zhou, Minghui and Turhan, Burak and Hoda, Rashina and Hata, Hideaki and Robles, Gregorio and Fard, Amin Milani and Alkadhi, Ran},
     da = {2020/11/01},
     date-added = {2020-11-03 18:34:31 +0900},
     date-modified = {2020-11-03 18:34:31 +0900},
     isbn = {1573-7616},
     journal = {Empirical Software Engineering},
     number = {6},
     pages = {4927--4961},
     title = {Pandemic programming},
     volume = {25},
     year = {2020},
     bdsk-url-1 = {https://doi.org/10.1007/s10664-020-09875-y}
   }
   
   

7. Feldt, R. and Yoo, S., Flexible Probabilistic Modeling for Search Based Test Data Generation. Proceedings of the International Workshop on Search Based Software Testing (SBST 2020). [pdf] [bibtex]

     @inproceedings{Feldt2020aa,
     author = {Feldt, Robert and Yoo, Shin},
     booktitle = {Proceedings of the International Workshop on Search Based Software Testing (SBST 2020)},
     date-added = {2020-02-29 16:42:47 +0900},
     date-modified = {2020-02-29 16:43:23 +0900},
     title = {Flexible Probabilistic Modeling for Search Based Test Data Generation},
     year = {2020}
   }