Latest Publications

1. Binkley, D., Gold, N., Islam, S., Krinke, J., & Yoo, S. (2019). A comparison of tree- and line-oriented observational slicing. Empirical Software Engineering. [bibtex]

     @article{Binkley2019aa,
     author = {Binkley, David and Gold, Nicolas and Islam, Syed and Krinke, Jens and Yoo, Shin},
     date-added = {2019-02-11 16:14:28 +0900},
     date-modified = {2019-02-11 16:27:55 +0900},
     day = {24},
     issn = {1573-7616},
     journal = {Empirical Software Engineering},
     month = jan,
     title = {A comparison of tree- and line-oriented observational slicing},
     year = {2019},
     bdsk-file-1 = {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},
     bdsk-url-1 = {https://doi.org/10.1007/s10664-018-9675-9}
   }
   
   

2. Sohn, J., & Yoo, S. (2019). Why Train-and-Select when you can use them all? Ensemble Model for Fault Localisation. In Proceedings of the Annual Conference on Genetic and Evolutionary Computation. [bibtex]

     @inproceedings{Sohn2019aa,
     author = {Sohn, Jeongju and Yoo, Shin},
     booktitle = {Proceedings of the Annual Conference on Genetic and Evolutionary Computation},
     date-added = {2019-04-08 22:17:11 +0900},
     date-modified = {2019-04-08 22:17:11 +0900},
     series = {GECCO 2019},
     title = {Why Train-and-Select when you can use them all? {E}nsemble Model for Fault Localisation},
     year = {2019}
   }
   
   

3. Kim, J., Feldt, R., & Yoo, S. (2019). Guiding Deep Learning System Testing using Surprise Adequacy. In Proceedings of the 41th International Conference on Software Engineering. [bibtex]

     @inproceedings{Kim2019aa,
     author = {Kim, Jinhan and Feldt, Robert and Yoo, Shin},
     booktitle = {Proceedings of the 41th International Conference on Software Engineering},
     date-added = {2019-02-11 16:22:24 +0900},
     date-modified = {2019-02-11 16:22:24 +0900},
     series = {ICSE 2019},
     title = {Guiding Deep Learning System Testing using Surprise Adequacy},
     year = {2019}
   }
   
   

4. Shin, D., Yoo, S., & Bae, D. H. (2018). A Theoretical and Empirical Study of Diversity-aware Mutation Adequacy Criterion. IEEE Transactions on Software Engineering, 44(10), 914–931. [pdf] [bibtex]

     @article{Shin2017rw,
     author = {Shin, D. and Yoo, S. and Bae, D. H.},
     date-modified = {2019-02-11 16:15:09 +0900},
     issn = {0098-5589},
     journal = {IEEE Transactions on Software Engineering},
     month = jul,
     number = {10},
     pages = {914-931},
     title = {A Theoretical and Empirical Study of Diversity-aware Mutation Adequacy Criterion},
     volume = {44},
     year = {2018},
     bdsk-url-1 = {http://dx.doi.org/10.1109/TSE.2017.2732347}
   }
   
   

5. Papadakis, M., Shin, D., Yoo, S., & Bae, D.-H. (2018). Are Mutation Scores Correlated with Real Fault Detection? A Large Scale Empirical study on the Relationship Between Mutants and Real Faults. In Proceedings of the 40th International Conference on Software Engineering (pp. 537–548). [pdf] [bibtex]

     @inproceedings{Papadakis2018hi,
     author = {Papadakis, Mike and Shin, Donghwan and Yoo, Shin and Bae, Doo-Hwan},
     booktitle = {Proceedings of the 40th International Conference on Software Engineering},
     date-added = {2018-02-19 06:31:40 +0000},
     date-modified = {2018-07-29 13:20:36 +0900},
     month = may,
     pages = {537-548},
     series = {ICSE 2018},
     title = {Are Mutation Scores Correlated with Real Fault Detection? A Large Scale Empirical study on the Relationship Between Mutants and Real Faults},
     year = {2018}
   }
   
   

6. Liu, K., Kim, D., Bissyande, T. F., Yoo, S., & Traon, Y. L. (2018). Mining Fix Patterns for FindBugs Violations. IEEE Transactions on Software Engineering, to Appear. [bibtex]

     @article{Liu2018aa,
     author = {Liu, K. and Kim, D. and Bissyande, T. F. and Yoo, S. and Traon, Y. Le},
     date-added = {2018-12-08 11:10:59 +0900},
     date-modified = {2018-12-08 11:11:15 +0900},
     issn = {0098-5589},
     journal = {IEEE Transactions on Software Engineering, to appear},
     title = {Mining Fix Patterns for FindBugs Violations},
     year = {2018},
     bdsk-url-1 = {https://doi.org/10.1109/TSE.2018.2884955}
   }
   
   

7. Binkley, D., Gold, N., Islam, S., Krinke, J., & Yoo, S. (2018). A Comparison of Tree- and Line-Oriented Observational Slicing. Empirical Software Engineering, to Appear. [bibtex]

     @article{Binkley2018ol,
     author = {Binkley, David and Gold, Nicolas and Islam, Syed and Krinke, Jens and Yoo, Shin},
     date-added = {2018-12-03 10:23:09 +0900},
     date-modified = {2018-12-03 10:25:53 +0900},
     journal = {Empirical Software Engineering, to appear},
     title = {A Comparison of Tree- and Line-Oriented Observational Slicing},
     year = {2018}
   }