COINSE

Computational Intelligence for Software Engineering Lab

MSc Recruiting Autumn 2022: We are looking for new members!


Our research focuses on the exciting intersection between software engineering and machine intelligence.

Recent Updates

Jun 12, 2022

Our new paper "FDG: A Precise Measurement of Fault Diagnosability Gain of Test Cases" is accepted at ISSTA 2022

A COINSE paper about fault diagnosability gain has been accepted at ISSTA 2022. [more...]
Mar 26, 2022

Congratulations, Dr. Seongmin Lee!

Seongmin Lee successfully defended his PhD thesis, the second from from COINSE group. [more...]
Mar 12, 2022

A new paper about automatically augmenting equivalent mutant dataset has been accepted at MUTATION 2022

We present an automated technique to augment equivalent mutant dataset. [more...]
Feb 9, 2022

Our new paper "Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA" is accepted to ICSE-SEIP 2022

We present a technique for identifying shared root causes of test breakages by combining multiple information sources associated with the failing tests. [more...]
Jan 12, 2022

Our paper "Predictive Mutation Analysis via Natural Language Channel in Source Code" is accepted to TOSEM

This paper aims to predict a full kill matrix resulted from mutation analysis by leveraging Natural Language channel in source and test code. [more...]
Dec 28, 2021

A new paper about GUI smoke test repairing technique has been accepted at ICST 2022 Industry Track

We present a new repair technique for View Identification Failures (VIF) in GUI tests from a collaboration work between COINSE and Samsung Research. [more...]

Latest Publications

  1. Kim, J., Feldt, R. and Yoo, S., Evaluating Surprise Adequacy for Deep Learning System Testing. ACM Transactions on Software Engineering and Methodology. to appear, (2022). [pdf] [bibtex] 
      @article{Kim2022ap,
  author = {Kim, Jinhan and Feldt, Robert and Yoo, Shin},
  title = {Evaluating Surprise Adequacy for Deep Learning System Testing},
  year = {2022},
  month = jun,
  publisher = {Association for Computing Machinery},
  address = {New York, NY, USA},
  journal = {{ACM} Transactions on Software Engineering and Methodology},
  volume = {to appear},
  series = {TOSEM}
}
  2. An, G. and Yoo, S., FDG: A Precise Measurement of Fault Diagnosability Gain of Test Cases. Proceedings of the 31st ACM SIGSOFT International Symposium on Software Testing and Analysis, to appear. [pdf] [bibtex] 
      @inproceedings{An2022pb,
  author = {An, Gabin and Yoo, Shin},
  booktitle = {Proceedings of the 31st ACM SIGSOFT International Symposium on Software Testing and Analysis, to appear},
  date-added = {2022-05-30 16:14:30 +0900},
  date-modified = {2022-05-30 16:14:41 +0900},
  series = {ISSTA 2022},
  title = {{FDG}: A Precise Measurement of Fault Diagnosability Gain of Test Cases},
  year = {2022}
}
  3. Kang, S. and Yoo, S., Language Models Can Prioritize Patches for Practical Program Patching. Proceedings of the 3rd International Workshop on Automated Program Repair (to appear). [pdf] [bibtex] 
      @inproceedings{Kang2022kl,
  author = {Kang, Sungmin and Yoo, Shin},
  booktitle = {Proceedings of the 3rd International Workshop on Automated Program Repair \emph{(to appear)}},
  date-added = {2022-03-31 14:54:57 +0900},
  date-modified = {2022-03-31 14:54:57 +0900},
  title = {Language Models Can Prioritize Patches for Practical Program Patching},
  year = {2022}
}
  4. Chung, S. and Yoo, S., Augmenting Equivalent Mutant Dataset Using Symbolic Execution. Proceedings of the 17th International Workshop on Mutation Analysis. [pdf] [bibtex] 
      @inproceedings{Chung2022ae,
  author = {Chung, Seungjoon and Yoo, Shin},
  booktitle = {Proceedings of the 17th International Workshop on Mutation Analysis},
  series = {Mutation 2022},
  title = {Augmenting Equivalent Mutant Dataset Using Symbolic Execution},
  year = {2022}
}
  5. An, G., Yoon, J., Sohn, J., Hong, J., Hwang, D. and Yoo, S., Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA. Proceedings of the 44th IEEE/ACM International Conference on Software Engineering - Software Engineering In Practice Track, to appear. [pdf] [bibtex] 
      @inproceedings{An2022qe,
  author = {An, Gabin and Yoon, Juyeon and Sohn, Jeongju and Hong, Jingun and Hwang, Dongwon and Yoo, Shin},
  booktitle = {Proceedings of the 44th IEEE/ACM International Conference on Software Engineering - Software Engineering In Practice Track, to appear},
  date-added = {2022-01-14 11:06:21 +0900},
  date-modified = {2022-05-30 16:15:33 +0900},
  series = {ICSE SEIP 2022},
  title = {Automatically Identifying Shared Root Causes of Test Breakages in SAP HANA},
  year = {2022}
}
  6. Kim, J., Jeon, J., Hong, S. and Yoo, S., Predictive Mutation Analysis via Natural Language Channel in Source Code. ACM Transactions on Software Engineering and Methodology. to appear, (2022). [pdf] [bibtex] 
      @article{Kim2022xy,
  author = {Kim, Jinhan and Jeon, Juyoung and Hong, Shin and Yoo, Shin},
  date-added = {2022-01-14 11:03:15 +0900},
  date-modified = {2022-01-14 11:03:15 +0900},
  journal = {{ACM} Transactions on Software Engineering and Methodology},
  title = {Predictive Mutation Analysis via Natural Language Channel in Source Code},
  volume = {to appear},
  year = {2022}
}
  7. Yoon, J., Chung, S., Shin, K., Kim, J., Hong, S. and Yoo, S., Repairing Fragile GUI Test Cases Using Word and Layout Embedding. Proceedings of the 15th IEEE International Conference on Software Testing, Verification and Validation, Industry Track. [pdf] [bibtex] 
      @inproceedings{Yoon2022fs,
  author = {Yoon, Juyeon and Chung, Seungjoon and Shin, Kihyuck and Kim, Jinhan and Hong, Shin and Yoo, Shin},
  booktitle = {Proceedings of the 15th IEEE International Conference on Software Testing, Verification and Validation, Industry Track},
  date-added = {2022-01-14 11:02:40 +0900},
  date-modified = {2022-01-14 11:02:40 +0900},
  series = {ICST 2022},
  title = {Repairing Fragile GUI Test Cases Using Word and Layout Embedding},
  year = {2022}
}